Surface Analysis
SIMS - for depth profiling, surface composition measurement, and elemental imaging, Hiden's SIMS Workstation provides a complete analytical facility.
SIMS Workstation: A complete SIMS analysis facility.
MAXIM Quadrupole SIMS Analyzer: For static and dynamic SIMS
applications.
IFG Series Ion and Ion/FAB Guns: For surface and depth analysis
applications.
EQS SIMS: 'Bolt-On' probes.
3F Series: Triple filter high performance quadrupole mass
spectrometers.
PIC Mass Spectrometers: Pulse ion counting detection.
RGA Series: RGA series quadrupole mass spectrometers.
click here for more information on Hiden's surface analysis
instruments